Quantitative surface analysis with Nanosurf's Nanite Atomic Force Microscope
Surface morphology is an important property for many high-tech surfaces with features as small as a few nanometers and surface roughness below one nanometer. The Nanite Atomic Force Microscope (AFM) from Nanosurf is the tool of choice for surface analysis of all shapes and sizes of workpieces. It delivers nanoscale precision measurements and is small enough, at less than 48x87x61mm, to allow integration into virtually any imaginable environment.
The NaniteAFM is a versatile tool that can be used across various industries, from nanotechnology to data storage and precision optics. Its ability to unveil intricate nanoscale surface details, including sub-nanometer roughness, makes it invaluable for diverse applications such as ceramics and glass analysis.
The NaniteAFM is designed for ease of use and integration. Its compact, robust design, with a tip-scanner, two inspection video cameras, and an on-board approach motor, fits into an exceptionally small footprint. It contains everything needed to operate independently, making integration a breeze. With just 300cm3 in space and a stable docking site, you can mount the AFM and start using it right away.
The NaniteAFM uses a dovetail mounting plate at the back to allow quick and reproducible mounting. The use of cantilevers with alignment grooves makes laser alignment unnecessary. For integration, this guarantees a well-defined offset between the cantilever tip and other components of a setup, for example, an indenter. This exceptional accuracy allows switching between the components without searching for the right area, thus reducing off-time and handling during experiments.